V2_TEC

Redesigned PCB for simultaneous Peltier control and surface resistance measurement

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Composition

The complex consists of two boards - Signal and Power. The power acts like as a controller of the Peltier element. Signal measures surface resistance and temperature. In the table, the top line is the signal board. Lower - power. Drawings as part of a work of art.

More details about the device can be understood from the schematic drawing here. The notes are in Russian.

The controller for the complex is STM32L432KC Nucleo.

Reference Information:

• To control the Peltier element, a 100 kHz PWM is used.
• IRS2104 is used to control transistors.
• The measurement of surface resistance is carried out by the four-probe method.
• Temperature measurement is carried out by pt100.
• There is an additional port for the I2C protocol

4point_probe

	Four point probe is used to measure resistive properties of semiconductor wafers and thin films [1].

In this case are studing the I - V characteristic of an element depending on the temperature of the sample. It is important to understand the I – V characteristic near the metal-insulator phase transition (MIT), which is about 68 degrees Celsius. You must understand that the ultimate goal is to stabilize the temperature to a specific value. More about the TEC control [2]